By pennNET Staff

By pennNET Staff

SEMICON West ’00—July 14, 2000—In San Jose, Calif., Aetrium Incorporated demonstrated its new dynamic temperature IC test handler and its new series of small component IC test handlers.

The Model DTX utilizes dynamic conducive temperature control for high-volume production IC test handling applications. It can be configured in single or multiple test sites ranging up to 64 sites, say officials with the St. Paul, Minn.-based company.

Unlike conventional test handler designs, which use a chamber to thermally condition ICs before and during test, the Aetrium DTX uses proprietary conductive thermal technology to monitor and control the temperature of each IC under test, say company officials. This design allows the user to test devices dissipating up to 100 watts/cm2 while maintaining the device under test temperature set point within +2°C at the test site, they say.

The Model 8832 Small Component Integrated Test Handler is designed for high volume production test of SOT, TO, micro lead frame, SON and QFN device type packages. The product is a member of the company’s SC Series and accepts devices in bulk format with a turret-based handling process. The Model 8832 is capable of operating at rates of up to 20,000 units per hour. It also offers the option of multi-site testing and integrates other processes such as laser marking, lead and mark inspections and multiple tape and reel outputs, say company representatives.