300mm Wafer Probe Card for Burn-In Test

The latest addition to its Harmony family of full-area, 300mm wafer probe solutions — the Harmony wafer-level burn-in (WLBI) probe card — is reportedly designed to maximize throughput, as well as ensure higher quality and reliability of semiconductor devices. The Harmony WLBI probe card can contact ~40,000 test pads in one touchdown, enabling the testing of an entire 300mm wafer at high temperature (up to 130°C). The Harmony WLBI probe card incorporates advanced electronics and a new 3D MEMS MicroSpring contactor, designed to withstand the rigors of high-temperature burn-in testing and minimize cleaning, further increasing probe card availability and test cell productivity. FormFactor Inc., Livermore, CA, www formfactor.com.


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