MIG seminar targets MEMS testing

March 2, 2011 – A two-day seminar later this month in San Jose will offer insights into testing of MEMS inertial sensors, and seek to develop a "strategic plan" to decrease cost and increase efficiency of MEMS device testing.

The two-day MEMS Testing Standards Workshop and M2M Forum, hosted by the MEMS Industry Group (MIG) on March 16-17, will first offer a testing standards workshop, looking at current practices, needs, and opportunities for qualifying and testing inertial sensors. Speakers include Analog Devices, Acutronic, MEMSCAP, and NIST. Keynoting an evening reception will be Gary O’Brien, director of corporate research in Robert Bosch’s advanced MEMS design group, reviewing the company’s MEMS fabrication techniques and the importance of test procedures.

The second day will encompass a "M2M Forum" (née MEMS Technology Roadmap and Industry Congress, or METRIC), with the goal of laying out an industry plan for reducing cost of MEMS devices through testing strategies. Working groups will focus on system-level testing (moderated by TI and Silex Microsystems), innovations in testing (moderated by Acuity and AM Fitzgerald), and MEMS testing protocols and standards (moderated by NIST and the Science Technology Policy Institute).

The event is being held March 16-17 at the Doubletree San Jose hotel. Go to the MEMS Industry Group’s Web site for information on registering. And take the MIG’s (anonymous) survey on what MEMS standards are in use at your company or organization.


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