We live in an increasingly connected world, combining computers, communications and consumers through technologies that are beginning to merge our virtual worlds with our real worlds. Ubiquitous connectivity, video with ultimate graphics, and 3D imaging are all key drivers for technology development. They’re penetrating the market very rapidly, and serve to illustrate the seemingly insatiable appetite of consumers for the advanced semiconductor devices behind the technologies.
Luc Van den hove, imec president and CEOLuc Van den hove, president and CEO of Belgian research center imec, described the networking, gaming and increasingly healthcare-related consumer technologies yesterday morning as a means to show the ever-accelerating need for data handling and computing power, and the relentless march of semiconductor scaling. Van den hove was the keynoter at this year’s Sokudo Lithography Breakfast Forum, where he put all this technology development into a perspective around lithography advances and continuing challenges.
For nearly 40 years, lithography was the only enabler of continued traditional scaling, Van den hove said, pointing out that this phase ended at the beginning of this decade when materials innovation (strained silicon, SiGe stressors, high-k/metal gates, etc.) took over at least part of the responsibility. For the next technology nodes, structural innovations such as finFETs will also be introduced, and could take the technology to 15 nm. And beyond 15 nm could see extreme high-mobility channel materials, for example.
Another technology innovation that is now beginning to take over from lithography’s traditional scaling is 3D integration, which brings vertical scaling into the equation and will help to increase performance considerably, Van den hove said.
Ultimately, however, the point is that what used to be a lithography-dominated world is now driven by what Van den hove referred to as concurrent scaling — enabled by lithography, materials innovation, and 3D stacking.
Evolution vs. revolution
Lithography continues to innovate and advance. When Van den hove last gave a keynote speech at the Lithography Breakfast Forum in 2006, he focused on the 32 nm node, posing the question: evolution or revolution? To be sure, the lithography technologies being used in production today have largely come about from an evolutionary perspective. Examples of that include computational lithography such as source mask optimization (SMO), used to enlarge the process window and squeeze as much out of existing 193 nm equipment as possible; and double patterning, which is also able to extend 193 nm immersion through a variety of schemes.
But Van den hove urged that the industry really needs to put in place EUV lithography, which is the most likely technology to carry the lithography forward, he said. One could argue that EUV is an evolutionary change as well, as an extension of optical lithography at lower wavelengths, but it’s a pretty massive departure from today’s excimer lasers and transmissive optics operating in atmosphere.
The beauty of EUV is its tremendous resolution power, Van den hove commented, and its higher k factors, which make life for the lithographers much easier. “Of course, fully reflective optics is creating quite a lot of problems,” he said, adding that the last issues related to the source “are being tackled at this moment.”
Imec, working on one of two existing EUV alpha demo tools from ASML, has been able to put a lot of work into EUV discovery, and seems to have become increasingly confident about its capabilities over the years. “We’ve exposed many wafers, and this is what is needed to mature the technology and solve problems to bring EUV into manufacturing,” Van den hove said. Imec has seen significant improvements in resist materials during last year, he also noted, adding, “We’re now getting resists that are getting very close to the targets in terms of sensitivity and line width roughness.”
Imec is one of six organizations that is slated to receive one of ASML’s pre-production EUV tools, the NXE:3100. The tools will begin shipping before year end. ASML very recently achieved first light with the first system — the Cymer source integrated and operating. Also speaking at the Lithography Breakfast Forum, Hans Meiling, ASML’s director product management EUV, gave an update on the integration status of the 3100. As of this month, ASML has completed the integration of three of the systems — one being used for investigating the status of throughput and overlay; another for imaging; and the third for a combination of imaging and overlay, Meiling said. Three more systems are in various stages of build-up.
Although the first EUV exposures have been made with one tool, the Cymer source is not yet up to full power. Two power upgrades are planned before the first lithography tool will be shipped to a customer. The first upgrade, Meiling explained, will increase CO2 laser power by increasing the laser gain length. The second upgrade will increase CO2-to-EUV conversion efficiency.
Maskless lithography
Meanwhile, imec’s Van den hove also talked about the prospects of maskless e-beam lithography, and where it might fit into next-generation lithography development. “EUV is the most likely technology, especially for high-volume activities, but I don’t mean to say there is no room for alternatives,” he said.
However, challenges in e-beam lithography for mainstream semiconductor manufacturing are also tremendous — comparable to EUV, but without the resources that EUV has had devoted to it. Imec considers multi-beam e-beam development to be understaffed, Van den hove said, making it difficult to overcome technical hurdles. He suggested (as was discussed at a recent Sematech event) that the industry should focus on developing the multi-beam technology for mask writer, “and see if the technology makes sense. Then we could develop it for wafer writing.”
Mapper Lithography seems to have different ideas, though, and continues to focus on the wafer writing business. Bert Jan Kampherbeek, vice president of market development and co-founder, said the Dutch company’s objective is to provide a solution for 32 nm half-pitch and beyond — for traditional contact and via layers at first, but also metal and other layers at 32 nm and beyond.
Although e-beam is known not only for its high resolution but also its slow throughput, Mapper’s roadmap takes the technology up to 10 wph. Although that’s still quite slow compared with other technologies, Kampherbeek conceded, the machines are small and cheap, so could be clustered extensively to bring throughput up to 100 wph or more.
But first Mapper needs to get its technology from the 110 parallel electron beams that are on its pre-alpha tool, to the planned 13,000 beams slated for high-volume production. “Actually, as you might think, especially from a data point, this is very challenging,” Kampherbeek said, noting that the total data rate needed is ~100 TB/s. “But we know we can do this with existing hardware.” Other technical challenges need to be overcome as well, including those related to electron optics, contamination and position stability.
— Aaron Hand, SEMICON West Daily News