Docking emission microscope system

Hypervision`s new transportable docking emission microscope (DEMI) is designed for docking to the face of ATE test heads and finds functional failures in devices with speeds of 150 to 300 MHz from the backside of the device. An addition to the company`s existing line of emission microscopes, the Visionary 2 and Visionary 2000, the DEMI unit has no upper device speed limit, docking the ATE test head directly to the emission microscope. Using test vectors from ATE equipment to light up transient functional defects, the unit`s imaging is triggered when the test vectors activate the failure. The company`s new backside thinning system for both devices and wafers — Chip UnZip — removes packaging materials, along with the desired thickness of silicon, in an automated sequence. The thinned silicon then allows defect emissions to escape to the backside. Emissions from both static and functional failures can be collected from the backside of the device and imaged with the new BEAMS (Backside Emission Microscope System).

Hypervision, Fremont, CA

(510) 651-7768