Fully automated AFM
Digital Instruments introduces a completely automated Atomic Force Microscope that includes automatic probe characterization, replacement and alignment. The Dimension 9000 is an on-line tool which allows complete automation for semiconductor meteorology and removes the need for operator intervention. The software is able to determine when the probe is worn or broken, and automatically loads a new one from a cassette holding 24 tips. User adjustment is not needed during the exchange process. The system must be installed in a Class 100,000 environment or better for a reliable exchange. It also features active vibration isolation and SECS II interface, and is SMIF compatible.
Digital Instruments, Santa Barbara, CA
(805) 899-3380, (800) 873-9750