Film Thickness Metrology Tool, PDM Solution Announced by Karl Suss

MUNICH, Germany and SOUTHBOROUGH, Mass.—June 28, 2000—Karl Suss has announced a new tool capable of measuring thick and thin films used in a wide range of applications. The company manufactures equipment and process technology for the micrelectromechanical systems (MEMS), microelectronics, and semiconductor markets.

By Stephanie J. Levy


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