Zygo Introduces IM-12 Probe Mark Analysis and Inspection System

MIDDLEFIELD, CT—July 6, 2000—Slated to debut at the upcoming Semicon West show in San Francisco, Calif., the new IM-12 Probe Mark Analysis System from Zygo is designed to analyze the size and position of probe marks and offers an optional feature to inspect probe needles.

By pennNET staff


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