Milpitas, California–Nov. 20, 2000–ST Assembly Test Services (STATS), a provider of semiconductor testing and advanced packaging services, has developed a strip handler for the multiple testing of integrated circuits (ICs). The technology is designed to reduce test cost and produce greater efficiency by eliminating a medium of transfer, such as trays or tubes, used in standard handlers.
The number of ICs tested simultaneously ranges from dozens to hundreds on a single strip, according to STATS, and there is no restriction to the number of standard test sites in the strip handler if sufficient resources are available.
“This new development broadens our test capabilities and improves our overall support services to our customers,” says Chee-Keong Tan, STATS’ vice president, Worldwide Strategic Test Development.