Foster City, California–SCANIS Inc., an image analysis software company, has been awarded a patent in the U.K. for its semiconductor yield management products. SCANIS has also secured a patent in the U.S. covering its Automatic Semiconductor Wafer Sorter/Prober with Extended Optical Inspection. Other foreign semiconductor patents are pending.

“We have several products from our SemiScan subsidiary targeted for the European market, and this patent award greatly enhances our visibility and competitive position overseas,” says Robert Chapman, SCANIS chairman and CEO.

U.K. Patent No. 2,329,961 and the U.S. patent cover SCANIS’ intellectual property, which the SCANIS SemiScan subsidiary now uses to improve the manufacturing yields of semiconductor wafers during the manufacturing process.