Ibis elects Yuri Erokhin as VP of wafer technology

August 23, 2001 – Danvers, MA – Ibis Technology Corp. has elected Yuri Erokhin as its VP of wafer technology. Ibis also announced the resignations of two directors, Geoffrey Ryding and Peter Rose, who resigned to pursue other business opportunities together.

Yuri Erokhin joined Ibis in October 2000 as director of wafer technology, after a five-year career at Eaton Corp. (now Axcelis Technologies) where he was director of process technology in the Implant Systems Division. Erokhin led the department responsible for process development, worldwide applications support, and equipment demonstrations to prospective customers.

Prior to Axcelis, Erokhin was a research associate at North Carolina State U. investigating formation of silicided shallow junction and process-induced crystal defects in silicon. He holds a Ph.D. in microelectronics technology.


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