Teradyne Inc., Boston, MA, has introduced what it calls the “next step” in high-volume, high-mix IC test evolution: the Integra FLEX.
A universal slot architecture combined with self-contained SOC tester per pin instruments provide production managers with new freedom to match test capacity to device coverage needs. Spanning multi-site DFT to standard analog to SOC, Integra FLEX will change the way IC makers and subcontract test companies think about the mix of equipment they need on their test floors, claims Teradyne.
Independent time tracks per instrument and background DSP processing boost efficiency, giving FLEX high site count concurrent test capability. Multi-level IG-XL5 software helps test engineers get products to market sooner by combining low level tester control with a template authoring environment. Already in use by lead customers, Integra FLEX will be demonstrated April 16-18 at the industry tradeshow Semicon Europa in Munich, Germany.
“High-volume, high-mix device manufacturing has changed production test,” said Mark Jagiela, Teradyne VP and GM, semiconductor test business group. “IC manufacturers and subcontract test companies want fewer tester types and wider device coverage.”
Unlike conventional testers with centralized clocks and restricted instrument arrangements, Integra FLEX is more a ‘tester array.’ Universal slots allow users to target FLEX for today’s device plan, knowing that they can reconfigure the system easily when those needs change. Each instrument module is independent, with local clock, sequencer, and dynamic setup. Parallel DC-to-microwave analog, high density CMOS differential digital, scan and memory test features all reside in Integra FLEX’s air cooled test head. FLEX offers wide device coverage and lower capital cost.
Integra FLEX multi-level IG-XL5 gives test engineering, for the first time, the ability to mix fully graphic template programming, high-level test procedures, and low level precise control. This software promotes portable test IP without the overhead of repeated setup commands of conventional systems. With the ability to go from single-site test to multi-site test quickly, FLEX supports fast production volume ramps.