July 9, 2002 – San Jose, CA – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has unveiled DefectID, automatic defect classification software that helps improve manufacturing productivity and yields for wafer fabrication test, assembly, and packaging operations.

Working in conjunction with Electroglas’ QuickSilver automated wafer inspection systems, the new software employs algorithms to expand Electroglas’ existing defect classification capabilities to include random defects located anywhere on the surface of a wafer.

With the addition of DefectID, Electroglas’ QuickSilver wafer inspection systems are able to classify defects over the entire wafer surface without prior knowledge of potential trouble areas on the wafer, the company said. Users can create a defect library and review classification results using DefectID’s off-line training and analysis tool.

DefectID enables inspection engineers to determine whether specific machines or processes are generating an inordinate number of defects and act upon that information to eliminate points of recurring error, Electroglas said. Users can also change classifications, compare classification categories, and add or delete defects from categories using DefectID’s library management system.