Teradyne introduces TestStation SE in-circuit tester

Aug. 27, 2002 – Boston, MA – Teradyne’s assembly test division, a global provider of electronics testing and production solutions, has unveiled the immediate availability of the TestStation SE, a new addition to Teradyne’s family of in-circuit test systems.

The TestStation SE is for manufacturers of high volume electronics assemblies that require high throughput, test accuracy, and proven reliability at lower test costs, Teradyne said.

“The TestStation SE is designed to be a cost effective in-circuit test solution for the high-volume consumer, computer, and communications electronics market,” said Jim Ficaro manager of the electronics test group. “It combines the reliability and performance of Teradyne’s in-circuit test technologies, with a customer friendly test programming environment, and a worldwide network of support and service that is second to none.”

The TestStation SE is a small footprint in-circuit tester that can be configured with up to 2,560 all-real (non-multiplexed) channels, a high accuracy PRISM analog measurement instrument, and in-depth digital test capabilities, according to the company. It is available with a number of industry-standard fixture interfaces for preserving current investments and minimizing transition costs.

System hardware is controlled by Teradyne’s worksheet-based software. To better support manufacturing operations in China, the TestStation SE provides key operator user interface screens in Chinese or English.

The TestStation SE is fully supported by Teradyne’s D2B (Design to Build) software suite, featuring D2B A3, and D2B Strategist, Teradyne said.

Test capabilities for the TestStation SE include standard shorts and opens testing; analog value and digital function testing; vectorless opens testing using Deltascan and Framescan; reduced-access boundary scan testing using Teradyne’s advanced Victory software; fast programming of on board FLASH and ISP components using Lightning hardware, and combinational testing using optional VXI test instruments, Teradyne said.


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