SAN FRANCISCO, SEMICON West, July 22, 2002 — Agilent Technologies Inc. (NYSE: A) today announced a new cost-saving parametric test platform, developed in cooperation with ACCRETECH and Cascade Microtech Inc. The Agilent 4070 DC/RF parametric test solution is a complete, integrated test solution for direct current (DC) and radio frequency (RF) testing of RF-CMOS devices used in wireless, consumer electronics, high-speed Internet and other applications.
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