Pacific Nanotechnology launches new AFM

Jan. 8, 2003 — Pacific Nanotechnology Inc. said it has launched an atomic force microscope (AFM) for the imaging of wafers and storage media disks.

The Nano-I AFM can be used in process development, failure analysis and quality assurance for MEMS devices, magnetic read-write heads and other devices. It can visualize and measure surface structures with nanoscale dimensions.

The Nano-I, priced at about $100,000, joins the Santa Clara, Calif.-based firm’s Nano-R, a general purpose AFM for making routine images on structures with nanoscale features.

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