FSI and Solid State Technology launch Process Outlook Forum seminar series

Minneapolis, MN – FSI International Inc. and Solid State Technology, a PennWell publication, have announced the inauguration of the Process Outlook Forum Seminar Series.

The Process Outlook Forum is a monthly, Web-based seminar series open to everyone, but is specifically designed to provide value to engineers in the semiconductor industry, researchers, and industry watchers. Expert speakers will be invited to address a variety of issues pertaining to IC process technology challenges, from process tool development to the future of IC manufacturing.

“Never before have so many technology challenges and transitions converged at once. In order to find processing solutions to implement these changes in a timely fashion, and to extend Moore’s Law, the industry’s researchers and engineers must better leverage external resources,” said Don Mitchell, chairman and CEO of FSI. “The Process Outlook Forum will address the industry’s tough economic and technological challenges by providing open discourse and access to information, helping participants adapt to the ongoing changes.”

Jeffery Butterbaugh, fellow and surface conditioning chief technologist for FSI, will speak on “Surface Preparation Challenges for 90nm and Beyond” at the June 17 seminar.

“New materials, thinner films and narrower process windows are creating challenges in every step of the semiconductor fabrication process flow. Improving yields and yield ramps simultaneously requires far more automatic process control in advanced fabs. An exploration of these challenges, with an exchange of ideas and potential solutions by practitioners and process developers, is clearly needed, and the Web offers an opportunity to accomplish this efficiently. Our joint efforts with FSI are providing a timely interchange to address these needs,” commented David Barach, publisher of Solid State Technology.

Each seminar is comprised of a 30-minute presentation, followed by a 15-minute question and answer period. Participants can download the presentation from the Web and then listen to the seminar through a bridging conference call. The seminar recording will be available for a limited time after the presentation to accommodate those who cannot attend the live discussion.

To register, please visit www.fsi-intl.com/forum.


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