Haier, Agilent to test SOC equipment

July 7, 2003 – Agilent Technologies and Beijing Haier IC Designing Co., Ltd have announced that Haier will use Agilent’s 93000 system-on-chip testing equipment for its MPEG decode chip, the Hi2010. Yang Yaozhou, GM of Agilent’s China semiconductor testing division, said that the deal would open doors for further collaboration on IC designing and fabless projects.


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