Camtek releases wafer tool

August 5, 2003 – Camtek, Migdal Haemek, Israel, a developer of optical inspection systems, has unveiled its Falcon system for inspecting wafers in the final manufacturing stages. The tool, which offers surface inspection and 3D metrology for wafers up to 300mm, is aimed at wafer-level in-line inspection processes at end-of-line, bumping, and packaging facilities. Camtek says it will install the first Falcon systems by the end of 2003.


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