FormFactor unveils high-frequency tester

January 27, 2004 – FormFactor Inc., Livermore, CA, has introduced a new high-frequency probe card for testing DRAM die on-wafer. The system is capable of achieving 200MHz testing at 400Mb/sec. bandwidth. The company claims that Elpida Memory Inc. has realized at-speed wafer test on mobile RAM using the technology, and will use the technology to ramp its MRAM output for 2G-3G cell phone applications.


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