Lifetime testing focus of MEMS conference

Aug. 19, 2004 – This year’s MEMS Technology Roadmap and Industry Congress (METRIC) — the annual meeting of the MEMS Industry Group — will be a sequel of sorts.

The Pittsburgh-based trade association said the Sept. 29-30 conference in its hometown will focus on accelerated lifetime testing. The group considers it a logical progression from last year, when it examined broader issues of reliability and its impact on commercial development.

A committee of 18 industry professionals has been working since April to isolate the most pertinent questions regarding accelerated lifetime testing, and will use METRIC to answer them and provide recommendations. The association also will release a workbook at the conference that includes relevant data, case studies and results from an industry survey.

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