Veeco introduces new AFM

Jan. 18, 2005 — Veeco Instruments Inc. (Nasdaq: VECO), a Woodbury, N.Y.-based developer of solutions for nanoscale applications in the worldwide data storage, LED/wireless, semiconductor and scientific research markets, announced the release of its new NanoMan II atomic force microscope.

The NanoMan II features a new Hybrid XYZ scanner, and is able to perform highly accurate force curves, nanoindenting and pulling techniques, according to a company release. The new AFM operates in closed-loop mode in all three axes, enabling a single instrument solution for nanolithography, nanomanipulation, and imaging for material and life science applications.


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