AMD selects Keithley’s semiconductor test system for Fab 36

February 3, 2005 – Keithley Instruments Inc. announced yesterday that AMD has selected the Keithley model S680 DC/RF parametric test system to support full production of advanced logic chips at AMD’s new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

First marketed in 2003, Keithley’s model S680 DC/RF tester is designed for wafer-level parametric testing of wireless communications and high-speed digital devices. This tester dramatically increases overall throughput by combining two critical test functions in a single system; DC and RF tests can be combined in the same test sequence. This integrated approach eliminates the long calibration and test times typical of separate RF test solutions. It also eliminates the need for a separate, costly, RF-only prober.


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