FEI announces new scanning electron microscope

Mar. 2, 2005 — FEI Co. of Hillsboro, Ore., yesterday released the newest member of its Nova family of scanning electron microscope and DualBeam systems, the Nova NanoSEM.

The company says the NanoSEM is the world’s first low-vacuum, field emission scanning electron microscope solution for ultra-high resolution characterization of charging and/or contaminating samples such as organic materials, substrates, porous materials, plastics and polymers.


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