The awards program was established in 1979 to recognize outstanding technical achievement and meritorious contribution in the areas of semiconductor materials, wafer fabrication assembly and packaging, process control, test and inspection robotics and automation, or quality enhancement.

(March 15, 2005) Cleveland &#8212 Keithley Instruments has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Icheon, Korea-based Hynix Semiconductor Inc. The order includes testers for production process control of 300-mm wafers being produced in Hynix’s M3A fabrication facility. It also includes testers for production process control of 200-mm wafers being produced in Hynix’s M8/9 facility. The systems will monitor production of Hynix’s flash memory, DRAM, SRAM, and system IC devices.