FEI announces new S/TEM

April 19, 2005 — FEI Co. (Hillsboro, Ore.; Nasdaq: FEIC) announced a new scanning/transmission electron microscope, the Titan 80-300, dedicated to corrected microscopy.

The new system, which integrates aberration correction technologies, yields atomic-scale imaging with resolution below 0.7 Angstrom, according to the company. Results from FEI’s Nanoport in The Netherlands deliver Titan TEM information limits below 0.7 Angstrom and STEM resolution just below 1.0 Angstrom, without the addition of aberration corrector upgrades.

FEI says the system will be fully available for demonstrations after its official launch in August.


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