Nikon integrates industrial metrology and semiconductor inspection units

April 4, 2005 – Nikon Instruments Inc. has announced the integration of two high precision industrial metrology business units, Semiconductor Inspection, and Nexiv Vision Measuring Systems, under the SITECH Division located in Tempe, AZ. Two new departments have been established within the division: Vision Systems and Semiconductor Inspection.

This purpose of this move by Nikon is to improve customer responsiveness by building on the synergies of these high tech teams, and by coordinating their applications engineering and service departments, product management and sales teams, improve efficiency, and prepare Nikon for significant new business opportunities in Nikon’s precision measurement and inspection product roadmap.

The new SITECH Division will be lead by Takeshi Kamiya, general manager who reports to Lee Shuett, executive VP, Nikon Instruments Inc. Shuett reports to Fumitaka Akeda, president, Nikon Instruments.

“This important change will enable these two businesses to share the outstanding facilities at our Tempe office, and by combining our resources, personnel and facilities, position Nikon for broader growth within the semiconductor and vision systems measuring vertical business,” said Mr. Shuett.


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