ProMOS selects Agilent product for 300mm wafer fab

May 17, 2005 — Agilent Technologies Inc. has announced that ProMOS Technologies has selected the Agilent 4072B parametric test solution for its 300mm wafer Fab III at the Central Taiwan Science Park, Taiwan.

ProMOS chose the 4072B to test its high-performance commodity DRAM.

“We are happy to provide ProMOS the equipment it needs to drive its branded products, technology, and services to market quickly and at low cost,” said Minoru Ebihara, VP and GM of Agilent’s Hachioji Semiconductor Test Division, Automated Test Group.

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