June 2, 2005 — FormFactor Inc. (Nasdaq: FORM), a Livermore, Calif., developer of wafer test probe cards for semiconductor manufacturers, announced the commercial delivery of the first probe card built in its new manufacturing facility.
The company called the delivery a “major milestone” in a news release, citing the fact that the customer’s internal qualifications had been completed successfully. FormFactor’s wafer test probe cards are made using MEMS fabrication techniques. The cards use microspring interconnects to touch down on semiconductor wafers in order to test many sites in parallel.