Solid State Technology will be hosting a Webcast on single-wafer cleaning on June 28, 2005 at 1 pm EST.
The webcast is sponsored by SEZ and its title is “Backside and Bevel Defects: The Underrated Yield Killers?”
SST Editorial Director Bob Haavind will be moderating a panel of three esteemed speakers. More details will be forthcoming shortly.