FEI begins shipping Titan S/TEM

Aug. 2, 2005 — FEI Co. of Hillsboro, Ore. announced it has begun shipping its new scanning/transmission electron microscope (S/TEM), the Titan 80-300.

The new Titan provides sub-Angstrom imaging and analysis and is intended to allow researchers to explore the relationships between structures and properties at the nanoscale. The new system is the most powerful member of FEI’s fleet of S/TEM and focused ion beam tools.

The company says the first shipments will begin in the current fiscal quarter. Among the first customers in line for delivery include The Center for Accelerated Maturation of Materials at Ohio State University, the department of inorganic chemistry and catalysis at the Fritz-Haber Institute in Germany, Samsung Advanced Institute of Technology in Korea, and Instituto Mexicano del Petroleo/IMP in Mexico.


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