Korean nano center orders Accent metrology tools

Sep. 7, 2005 — Accent Optical Technologies, a supplier of lattice engineering and photolithography process control tools, announced that the Korean Advanced Nano Fab Center has ordered a suite of Accent metrology tools.

The tools are slated to be used in the development of advanced materials for use in nanoscale electronic and optical devices. The order includes an RPM Photoluminescence mapping tool, an ECVpro electrochemical CV profiler and a Hall Effect measurement system.

The Korean Advanced Nano Fab Center was established in late 2003 with the mission to enhance Korean competitiveness in nanotechnology and contribute to the development of relevant industries by constructing an R&D support system in the field of non-silicon-based nano devices. Its partners include Samsung and LG, as well as leading Korean Universities.

The center is intended to provide facilities for the development of nano-electronic and photonic devices and hybrid compound semiconductor devices, as well as support basic research in the emerging fields of nanotubes, molecular devices and spintronics.

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