FEI installs new microscope at Ohio State

Nov. 11, 2005 — FEI Co. announced that Ohio State University’s Center for Accelerated Maturation of Materials (CAMM) has become the first North American site to install and begin using its new scanning/transmission electron (S/TEM) microscope, the FEI Titan 80-300.

The new system, which yields sub-Angstrom imaging and analysis capabilities, is expected to enhance researchers’ abilities to make new discoveries on the structure-property relationships of a wide spectrum of materials.


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