Veeco Instruments promotes pair of key execs

Nov. 4, 2004 — Veeco Instruments Inc. (Nasdaq: VECO) announced that it has promoted two key executives responsible for the company’s largest revenue and margin growth this year — its metrology and ion beam operations.

Jeannine Sargent, formerly executive vice president and general manager of its research atomic force microscope/nano-bio business unit, has been named executive vice president, metrology and instrumentation. Sargent is now responsible for all Veeco atomic force microscope and optical profiler products. She will also maintain her corporate business development responsibilities.

Robert Oates, formerly senior vice president of Veeco’s ion beam operations, has been named senior vice president of data storage. He is now in charge of all of Veeco’s data storage process equipment products, including its ion beam etch and deposition, physical vapor deposition, atomic layer deposition, precision lapping, dicing and slicing product lines.


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