February 7, 2006 – The IEEE has approved a standard to establish a common metrics foundation for electrical properties in carbon nanotubes, in an effort to pave the way toward commercialization of the technology’s adoption in devices ranging from displays to ICs and sensors.

The standard, IEEE 1650, “Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes,” recommends equipment and procedures required to measure the low-level signals involved in working with nanotubes, including basic parameters for electrical conductivity, Hall effect, and other critical electrical properties of nanotubes and basic nanotube devices.

“There’s an impressive amount of work underway seeking to use nanotubes to fabricate next-generation devices,” said Daniel Gamota, IEEE 1650 Working Group chair. “These efforts have surfaced a strong need for uniform ways to evaluate nanotube electrical performance, so what is observed by one group can be confirmed by others.” Tests defined under the new standard “help bridge the gap between the laboratory and the production line so researchers can communicate effectively with those creating commercial nanotube applications,” he said.

Paul Brazis, IEEE 1650 Working Group vice chairman, added that the new standard meets a need to understand accuracy, repeatability, and consistency of nanotube electronic data to ensure confidence among both end users and vendors in nanotubes being developed and marketed.