Süss, Instrument Systems building LED test tool

March 9, 2006 – Süss MicroTec and Instrument Systems say they’ve developed a new high-throughput test system for LED devices at wafer level that can handle up to 70,000 LED dies/hour, to help prevent the costly mistake of packaging bad devices.

The semiautomatic system (upgradeable to fully automatic in the field) will integrate Süss’ BlueRay probe system with Instrument Systems’ high-precision optical measurement equipment. A prototype is being shown at Semicon China later this month.


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