May 11, 2006 – Keithley Instruments Inc., Cleveland, OH, and R&D magazine are launching a “Nanotechnology test and measurement applications contest,” for researchers and test scientists to show off their complex and advanced electrical measurements on nanoscale materials and devices.
The goal is to encourage the development and propagation of improved measurement techniques, performed on Keithley equipment, that will help the industry at large address miniaturization and nanotechnology challenges. Work can be research or product development in any nanotechnology discipline (electronics, biotechnology, structural material, etc.), and involved with electrical measurements on materials and devices.
Entries will be judged by the editors of R&D magazine; first place wins $2500, second place $1500, and third place $1000. Submissions must be filed online before June 30, at http://www.respond1.com/keithley/nanocontest.