KLA-Tencor unveils magnetic metrology system

May 12, 2006 – KLA-Tencor (Nasdaq: KLAC) unveiled its third-generation magnetic metrology system for the hard disk drive and semiconductor memory markets. Based on the MRW200 platform, the company says the MRW3 measures the magnetic properties of HDD recording heads and magnetoresistive random access memory (MRAM) on product wafers for production control and early detection of process issues that could adversely impact yield.

The MRW3 system has completed a beta evaluation at a semiconductor manufacturing company. The company will begin shipping the system this month.


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