Tester Extension Card

Pin Scale HX combines a full-function at-speed drive/receive automated test equipment (ATE) channel card with high-integrity loopback and extensive jitter capabilities to address built-in self test (BIST) and design for test (DFT). It also supports testing of devices that use embedded and forwarded clock schemes. Agilent Technologies Inc., Palo Alto, CA, www.agilent.com.


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