Microscope Achieves Resolution for Nanomaterials

(July 31, 2006) HILLSBORO, OR &#151 At the European NanoPort facility, FEI Company scientists have obtained directly interpretable transmission electron microscope (TEM) images with atomic resolution better than 1.4 &#197ngstr&#246m at an 80kV operating voltage. The Titan 80-300 corrected S/TEM microscope used in the research included an aberration corrector developed by CEOS GmbH.


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