Two-year Metrology Research Program Initiated

(July 28, 2006) LEUVEN, Belgium &#151 ICOS Vision Systems Corporation NV and IMEC, an independent research center for nanoelectronics and nanotechnology, will undertake a two-year joint exploration and development program (JEDP) into 3-D packaging inspection and metrology. The inspection solution supplier will provide technology and equipment for the research, which will be performed at IMEC’s laboratories and at ICOS Haasrode, a Belgian location.

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