Veeco introduces new scanning probe microscope

July 10, 2006 – Veeco Instruments Inc. of Woodbury, N.Y., announced the launch of its new Caliber low-cost, high-value scanning probe microscope (SPM).

The company says the Caliber is able to perform a variety of SPM research and industrial applications on samples of various sizes.

“Our new Caliber ‘mini-SPM’ provides a highly affordable, compact and flexible research solution for materials, surface sciences, and polymer studies,” said Jeannine Sargent, executive vice president of metrology & instrumentation, in a prepared statement.

“Furthermore, the Caliber’s attractive price point will make Veeco’s industry leading SPM technology attainable to a broader group of industrial researchers and makes an excellent entry-point SPM for new users in an educational setting or in emerging high-tech growth markets such as China and India.”

The Caliber’s open-platform, closed-loop design is intended to allow researchers to customize hardware and optimize electronics for application versatility. Other features include real-time software with line-by line analysis, oscilloscope, FFT, and leveling functions.


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