August 7, 2006 – Infineon Technologies AG has joined the Semiconductor Test Consortium (STC), a group promoting adoption of the Open Semiconductor Test Architecture (OPENSTAR) standard.
Infineon’s participation comes from a need to use an open platform concept for flexibility in testing its wide range of technologies in its portfolio, from discretes to power, automotive to RF, and mixed-signal ICs, noted Klaus Luther, Infineon’s senior director of corporate test technology and STC co-vice chairman. It is Infineon’s intention to eliminate redundant R&D expenses, such as switching cost by architecture, along with interface and software convergence of our test solutions,” he added.
The STC was founded in 2003 to develop a common test architecture that is completely open, documented and supported via solutions available from all ATE vendors. That platform, OPENSTAR, is now supported by a total of 47 semiconductor, equipment and instrumentation companies and 27 universities, as well as several standard test interference language (STIL) users and individuals.