Veeco introduces next-gen Dektak surface profiler

Nov. 30, 2006 — Veeco Instruments Inc., a supplier of instrumentation to the nanoscience community, announced the launch of the new Dektak 150 Surface Profiler for high-performance research and industrial metrology applications.

The company says the Dektak 150 delivers the highest repeatability and lowest noise over the largest scanning range available for a stylus profiler, enabling Veeco’s customers to benefit from greater scan range and ease-of-use.

The modular design of the Dektak 150 enables it to be configured to meet stringent application requirements. The compact system is designed to accommodate samples up to 100 millimeters thick and performs long scans of 55 millimeters. The company says the half-millimeter vertical range is industry-leading standard Z performance, and a 1-millimeter option extends the vertical capabilities even further. With sub-nanometer step-height repeatability, the Dektak 150 accurately measures step-heights for thin films below 10 nanometers thick, up to nearly one-millimeter thick-films.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.