Nov. 30, 2006 — Veeco Instruments Inc., a Woodbury, N.Y., supplier of instrumentation to the nanoscience community, announced the release of the Wyko NT9300 and NT9800 Optical Profilers.

The company says the new NT optical profilers are ideal for non-contact surface metrology in a wide range of demanding industrial, research, and production applications including automotive, aerospace, semiconductor, MEMS, and biomedical devices.

The ninth-generation NT9300 and NT9800 profilers combine an innovative illumination system, and an industry proven platform to measure topographies from 0.1-nanometer to 10-millimeters to significantly extend non-contact surface measurement capabilities for materials analysis, quality assurance, and the process development and monitoring cycle. A novel harmonic drive scan mechanism and Veeco’s exclusive Laser Reference signal for Z position feedback provide unparalleled performance, scan accuracy and resolution.

John Wissinger, vice president of Veeco’s Optical/Industrial business, said the company’s new profilers deliver the power, resolution and accuracy demanded by the company’s most discriminating customers. “The design innovations in these instruments greatly reduce the number of moving parts, which increases uptime and improves long-term cost of ownership,” he said in a prepared statement.