Metrology firm tabs FEI exec as CEO

January 15, 2007 – Metrosol Inc., Austin-TX, a developer of optical reflectometry systems, has appointed Kevin Fahey as president and CEO, formerly VP and GM of FEI Co.’s fab market division. He will be charged with achieving “rapid sales expansion, operations efficiency, aggressive product positioning, and creating the highest level of service and support,” according to the company.

The company, a participant in the 2006 SEMICON West Technology Innovation Showcase (TiS), sells a short wavelength optical metrology system that collects optical reflectance data in the vacuum ultraviolet wavelength region down to 120nm, targeting applications ranging from engineered substrates and other advanced materials to gate dielectrics and metal gates, silicides, and capacitors. Its flagship product targets frontend 45nm/32nm semiconductor manufacturing; two other tools address R&D with different wavelength ranges and applications.

“Metrosol found itself on target for exponential growth in the semiconductor fab market,” and its directors and management “felt new leadership could expedite the organization to the next level,” the company said, in a statement.


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