Pacific Nanotechnology’s dual scanner for advanced research AFM system. (Photo: Pacific Nanotechnology)

Mar. 5, 2007 — Pacific Nanotechnology, Inc. (PNI), provider of the tabletop Nano-R AFM systems, has released a new, dual-scanner technology platform for research applications, the Nano-DST.

The Nano-DST promises a new approach to the world of atomic force microscopy (AFM). Its large-area scanner comes in three options to study areas up to 100, 200, or 400 microns in x and y. Using flexure design and light lever detection, these scanners exhibit particularly low bow and coupling.

The second scanner is a 5 micron tube design which is embedded in a dedicated sample puck. This may be used alone or when combined with the flexure scanner, the user is able to scan a large area to locate a specific feature and then zoom in to make a high resolution image. This is of benefit to those with the most challenging AFM imaging applications

The Nano-DST claims the first SPM controller to use two x,y,z scanning control cards backed with 24 bit electronics using industry standard National Instrument cards. These advanced components enable fast scanning where collection of a 300 line image is made in one second.