May 22, 2007 — Agilent Technologies Inc. has introduced the Magnetic AC Mode III (MAC Mode III) controller, which it says greatly enhances the utility of Agilent’s nanotechnology measurement instruments and better enables researchers to customize their experiments. The MAC Mode III is designed for particular application in areas that require high resolution and force sensitivity, such as biology, polymers, and surface science. Built on field-proven technology, this gentle, nondestructive atomic force microscopy (AFM) technique is designed for imaging delicate samples in liquid or air.

MAC Mode III offers three user-configurable lock-in amplifiers, affording researchers versatility, higher accuracy and quicker time to results. It has a wider operating frequency range — up to 6 MHz — enabling scientists to investigate higher harmonic modes. Built-in Q control further enhances the resonance peak. Higher harmonic imaging provides contrast beyond that seen with fundamental amplitude and phase signals, allowing scientists to collect additional information about mechanical properties of the sample surface.

The Agilent MAC Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM). Simultaneous, high-accuracy topography and surface potential measurements are facilitated by a servo-on-height cantilever approach that is not susceptible to scanner drift. KFM/EFM offers excellent utility for measuring dielectric films, metal surfaces, piezoelectrics and conductor-insulator transitions.

MAC Mode III can be operated simultaneously with environmental control, temperature control, electrochemical control and controlled fluid exchange. Agilent’s acoustic AC mode is included with MAC Mode III.