DRAM Probe Card

For testing smaller-sized, smaller-density DRAM devices (512 Mb and below), the PH150XP wafer probe card incorporates a MicroSpring contact design that accommodates more than 25,000 contacts. It suits testing of consumer and mobile DRAM packages with high pin counts.

The MT9928 semiconductor test handler system, with up to eight parallel test sites, supports 28,000 units-per-hour throughput and fast changeover between various package types. It reportedly offers temperature control and test accuracy.


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