The IX-70 can assist many micromachining applications. (Photo: JPSA)

May 21, 2007 — Developed for the repair of flat panel displays, micro circuits and wafers, the new IX-70 ChromAblate on-target inspection and short deletion system from J.P. Sercel Associates promises precision and power in a small package. This laser-based materials processing system is on display this week at the Society for Information Display International Symposium, a gathering of professionals in the electronic-display industry.

The IX-70 can be applied to a variety of micromachining applications, and can be configured with IR, visible, or UV wavelengths to process a wide range of materials from metals to polymers.

The system features precise control of laser power through an integrated adjustable attenuator. Various geometric shapes can be projected onto the work surface through an adjustable aperture and an optional mask indexing wheel. For alignment and inspection of the work surface, the IX-70 incorporates a co-axial high resolution CCD camera, adjustable zoom lens, and LCD display for real-time process viewing.

The IX-70 is available in multiple wavelengths, and offers high power for its size, up to 90mJ at 1064nm, 50mJ at 532nm, 11mJ at 355nm or 10mJ at 266nm. Its non-contact technique assures continuouse, maintenance-free operation.

In addition to its benchtop configuration, the IX-70 is also available in a gantry-mounted version for large FPD repair.